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Sakata, Osami*; Furukawa, Yukito*; Goto, Shunji*; Mochizuki, Tetsuro*; Uruga, Tomoya*; Takeshita, Kunikazu*; Ohashi, Haruhiko*; Ohata, Toru*; Matsushita, Tomohiro*; Takahashi, Sunao*; et al.
Surface Review and Letters, 10(2&3), p.543 - 547, 2003/04
Times Cited Count：142 Percentile：96.4(Chemistry, Physical)The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt(111) surface.
Agui, Akane; Saito, Yuji; Yoshigoe, Akitaka; Nakatani, Takeshi*; Matsushita, Tomohiro*; Mizumaki, Masaichiro*
Surface Review and Letters, 9(2), p.843 - 848, 2002/04
Times Cited Count：4 Percentile：26.08(Chemistry, Physical)no abstracts in English
Br]BrFujimori, Shinichi; Ino, Akihiro; Okane, Tetsuo; Fujimori, Atsushi; Okada, Kozo*; Manabe, Toshio*; Yamashita, Masahiro*; Kishida, Hideo*; Okamoto, Hiroshi*
Surface Review and Letters, 9(2), p.1065 - 1069, 2002/04
Times Cited Count：0 Percentile：0(Chemistry, Physical)no abstracts in English
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Mizumaki, Masaichiro*; Yoshii, Kenji; Kawamura, Naomi*; Nakazawa, Makoto*
Surface Review and Letters, 9(2), p.855 - 859, 2002/04
Times Cited Count：1 Percentile：7.77(Chemistry, Physical)no abstracts in English
Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao
Surface Review and Letters, 9(1), p.77 - 83, 2002/02
Times Cited Count：4 Percentile：26.08(Chemistry, Physical)no abstracts in English
Tanaka, Momoko; Kawachi, Tetsuya; Kado, Masataka; Hasegawa, Noboru; Sukegawa, Kota*; Lu, P.; Nagashima, Keisuke; Kato, Yoshiaki; Takenaka, Hisataka*
Surface Review and Letters, 9(1), p.641 - 644, 2002/02
Times Cited Count：12 Percentile：53.16(Chemistry, Physical)no abstracts in English
Muramatsu, Yasuji; Kuramoto, Kentaro*; Gullikson, E. M.*; Perera, R. C. C.*
Surface Review and Letters, 9(1), p.267 - 270, 2002/02
Times Cited Count：5 Percentile：30.57(Chemistry, Physical)no abstracts in English
